Scanning Acoustic Microscopes & Industrial Ultrasonic NDT Systems

Ultrasonic Non Destructive Testing of metals, alloys & composites;  Simple and Complex Contour shapes. Helps identify small defects with planar and depth coordinate information.

Scanning Acoustic Microscopy for your semiconductor failure analysis and reliability needs; discrete packages, IGBTs, bonded wafers, PEMS. Valuable tool for R&D, process development, customer returns and high volume quality inspection.

Custom engineered for inspecting Solar Panels, MACROVUE accommodates all size panels,

and allows detection of layer disbonds and bus bar bonding integrity.

Scanning Acoustic Microscopy (SAM) is a valuable tool in identifying  and stopping proliferation of counterfeit electronic components. SAM helps in identifying new parts that are misrepresented and old parts that are sold as new , and functional and nonfunctional counterfeiting.

Failure Analysis is paramount in Aerospace industry. With high performance alloys and composites, inspection for failure modes, failures, early cracks is an essential requirement. Ultrasonic NDT is one of the many methods that reliable inspect for such defects.

Failure Analysis and Reliability Testing of semiconductors in automative industry; power devices, IGBTs, Inverters, sensors, etc.