MACROVUE -P NexGen
Scanning Acoustic Microscope
Semiconductor & Electronics Failure Analysis, Reliability Counterfeit detection, voids, disbonds, die-attach, and etc.
Scan Area
Up to 2500 mm x 1500 mm
Inspection
Pulse Echo | Through Transmission
Simultaneous 2 JEDEC Trays C-Scan PE
Simultaneous 1 JEDEC Tray C=Scan PE|TT
Transducers
1 MHz to 230 MHz
Instrumentation
Digital Pulser-Receiver
Optional second channel
Up to 12 GHz Digitizer
Performance
Max Velocity 1.5 m/s on Scan Axis
0.5 micron encoder scan resolution
Accessories
Integrated Water Management
Form Factor
Stainless Steel Tank
HD LED Lighting
Applications
Solar Panels
Large Panels
Custom PCBs
Inspection & Analysis
Multi Zone Inspection (SALI)
C-Scans, B-Scans, A-Scan
Peak Amplitude & Time of FlightD
Defect Detection
Thickness Measurement
Cluster Analysis
Histogram
Void Analysis
Quantification
Go/No-Go Classification
User Interface
Modes: Advanced | Engineer | Operator